Continuing Education Resource Center

Detection and Reduction
of Transient Errors to Manage
Risk in Point-of-Care Testing

IL invites you to attend our Industry Workshop at the
69th AACC Annual Scientific Meeting and Clinical Lab Expo,
San Diego, CA

Objectives

  1. Describe the importance of transient error detection to improve risk management in point-of-care testing
  2. Discuss methods to detect and reduce the occurrence of transient errors
  3. Review the clinical advantages of transient error detection utilizing new IntraSpect technology in iQM2


Speakers

Theodore (Ted) E. Warkentin
James H. Nichols, PhD, DABCC, FACB

Professor of Pathology, Microbiology and Immunology
Medical Director of Clinical Chemistry and POCT
Vanderbilt University School of Medicine, Nashville, TN, USA

Annie Winkler
Sohrab Mansouri, PhD


Staff Scientist, Instrumentation Laboratory, Bedford, MA, USA
Key contributor to the development of Intelligent Quality
Management (iQM®)

Click below to apply for credit for attending.

IL is approved as a provider of Continuing Education programs in the
clinical laboratory sciences by the ASCLS P.A.C.E.® Program.

Date:
Wednesday, August 2, 2017

Time:
1:45-2:45 PM

Location:
Theater 2, located on the Expo Hall Floor, behind booth #6250
San Diego Convention Center, San Diego, CA, USA

Credit
1.0 CE credit will be offered through P.A.C.E.® and AARC